PART |
Description |
Maker |
50PA-411 |
LC HANDOVER TEST SYSTEM
|
JFW Industries, Inc.
|
6171-0 6171-2 |
Test Companion Test Kit For Fluke 20 & 70 Series DMM’s
|
Pomona Electronics
|
50PMA-010 |
TRANSCEIVER TEST SYSTEM
|
JFW Industries, Inc.
|
50PMA-011 |
TRANSCEIVER TEST SYSTEM
|
JFW Industries, Inc.
|
50PMA-015 |
TRANSCEIVER TEST SYSTEM
|
JFW Industries, Inc.
|
SG5010 |
Programmable Audio Test System
|
TeGam
|
4082F |
Flash Memory Cell Parametric Test System
|
Keysight Technologies
|
CBL-SERIES CBL-2FT-NMNM CBL-2FT-SMNM CBL-2FT-SMSM |
From old datasheet system Coaxial-Flex Test Cables 50з DC to 18 GHz
|
MINI[Mini-Circuits]
|
SCANPSC110FSC |
SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support)
|
Fairchild Semiconductor Corporation
|
AD7226 AD7226BQ AD7226KN AD7226KP AD7226KR AD7226T |
-0.3, 17V; 500mW; LC2MOS quad 8-bit D/A converter. For process contol, automatic test equipment and calibration of large system parameters
|
AD[Analog Devices]
|
2SC982 2SC982TM E001082 |
NPN EPITAXIAL TYPE (PRINTER DRIVE/ CORE DRIVER AND LED DRIVE/ LOW FREQUENCY AMPLIFIER APPLICATIONS) SMA MALE TO TNC MALE; 18GHz PRECISION TEST CABLE ASSEMBLY; 36 INCHES LONG. WIDEBAND COVERAGE DC - 18 GHZ TEST CABLES. FLEXIBLE FOR EASY CONNECTION NPN EPITAXIAL TYPE (PRINTER DRIVE, CORE DRIVER AND LED DRIVE, LOW FREQUENCY AMPLIFIER APPLICATIONS) From old datasheet system
|
Toshiba Corporation TOSHIBA[Toshiba Semiconductor]
|
44281-0001 44281-0002 44281-0003 44281-0004 44281- |
Mini-Fit Test Plugs Mini-Fit垄芒 Test Plugs
|
Molex Electronics Ltd.
|